ASTM E1127-91(1997)

Standard Guide for Depth Profiling in Auger Electron Spectroscopy

NORM herausgegeben am 10.9.1997

Englisch -
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The information about the standard:

Designation standards: ASTM E1127-91(1997)
Note: UNGÜLTIG
Publication date standards: 10.9.1997
The number of pages: 4
Approximate weight : 12 g (0.03 lbs)
Country: American technical standard
Kategorie: Technische Normen ASTM

Annotation of standard text ASTM E1127-91(1997) :

Keywords:
Angle lapping, Argon atmospheres, Ball cratering, Crater edge profiling, Depth profiling, Gases, Ion sputtering, Noble gas ions, Nondestructive evaluation (NDE), Polishing properties, Spectroscopy-auger electron (AES), Sputter depth profiling data, Surface analysis-spectrochemical analysis, Xenon, ICS Number Code 71.040.50 (Physicochemical methods of analysis)