Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
NORM herausgegeben am 10.4.2000
Bezeichnung normen: ASTM E1217-00
Anmerkung: UNGÜLTIG
Ausgabedatum normen: 10.4.2000
Zahl der Seiten: 7
Gewicht ca.: 21 g (0.05 Pfund)
Land: Amerikanische technische Norm
Kategorie: Technische Normen ASTM
Keywords:
Absorbed current, Computer programs, Current measurement, Deflection, Detectors, Line scan, Oscilloscope, Raster scan, Scanning, Signal detection, Specimen area, Spectrometry, Spectroscopy-auger electron (AES), Spectroscopy-x-ray photoelectron, Surface analysis-spectrochemical analysis, Topography, Voltage, Waveform, specimen area contributing to detected signal in, photoelectron/auger-electron spectroscopy, practice, ICS Number Code 71.040.50 (Physicochemical methods of analysis)