
Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
NORM herausgegeben am 1.11.2006
Designation standards: ASTM E1438-06
Note: UNGÜLTIG
Publication date standards: 1.11.2006
The number of pages: 2
Approximate weight : 6 g (0.01 lbs)
Country: American technical standard
Kategorie: Technische Normen ASTM
Keywords:
ICS Number Code 29.045 (Semiconducting materials)