Standard Test Method for Measuring the Effective Surface Roughness of Optical Components by Total Integrated Scattering (Withdrawn 2003)
NORM herausgegeben am 1.1.1999
Bezeichnung normen: ASTM F1048-87(1999)
Anmerkung: UNGÜLTIG
Ausgabedatum normen: 1.1.1999
Zahl der Seiten: 5
Gewicht ca.: 15 g (0.03 Pfund)
Land: Amerikanische technische Norm
Kategorie: Technische Normen ASTM
Keywords:
Dielectrics, Diffuse reflectance, Effective surface roughness, Flat optical surfaces, Helium-neon laser, Integrated light scattering, Lasers and laser applications, Light-scattering, Metal mirrors, Microroughness, Mirrors, Monitoring-semiconductor processing, Nondestructive evaluation (NDE)-semiconductors, Radiation exposure-electronic components/devices, Reflectance and reflectivity-electronic materials/applications, Roughness, Scattering parameters, Solar collectors, Solar spectral irradiance