
Standard Test Method for Interstitial Atomic Oxygen Content of Silicon by Infrared Absorption with Short Baseline (Withdrawn 2003)
NORM herausgegeben am 10.12.2002
Designation standards: ASTM F1188-02
Note: UNGÜLTIG
Publication date standards: 10.12.2002
The number of pages: 9
Approximate weight : 27 g (0.06 lbs)
Country: American technical standard
Kategorie: Technische Normen ASTM
Keywords:
infrared absorption, infrared spectrophotometry, interstitial oxygen, oxygen, silicon, ICS Number Code 29.045 (Semiconducting materials)