ASTM F1192-00

Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices

NORM herausgegeben am 10.6.2000

Englisch -
Sicheres Online-PDF (81.70 EUR)

Englisch -

Gedruckt (81.70 EUR)

The information about the standard:

Designation standards: ASTM F1192-00
Note: UNGÜLTIG
Publication date standards: 10.6.2000
The number of pages: 11
Approximate weight : 33 g (0.07 lbs)
Country: American technical standard
Kategorie: Technische Normen ASTM

Annotation of standard text ASTM F1192-00 :

Keywords:
SEB, SEE, SEFI, SEGR, SEL, SEP, SEP cross section, SEU, single event, single event effect, single event phenomena, single event upset, space environment, ICS Number Code 31.080.01 (Semi-conductor devices in general)