Test Method for Total Mass Loss of Materials and Condensation of Outgassed Volatiles on Microelectronics-Related Substrates (Withdrawn 2000)

Informationen über die Norm:

Bezeichnung normen: ASTM F1227-89(1999)
Anmerkung: UNGÜLTIG
Ausgabedatum normen: 10.4.1999
Zahl der Seiten: 6
Gewicht ca.: 18 g (0.04 Pfund)
Land: Amerikanische technische Norm
Kategorie: Technische Normen ASTM

Die Annotation des Normtextes ASTM F1227-89(1999) :

Keywords:
Collected volatile condensable materials (CVCM), Condensables, Electrical conductors-semiconductors, Electronic materials/applications, Mass loss, Microelectronics industry, Outgassing properties, Silicon semiconductors, Thermoplastics, Thermosetting plastics, Total mass loss (TML), Vacuum testing, Volatile matter content, total mass loss of materials and condensation of outgassed volatiles on, microelectronics-related substrates, test, ICS Number Code 83.140.20 (Laminated sheets)