ASTM F1239-94

Standard Test Methods for Oxygen Precipitation Characterization of Silicon Wafers by Measurement of Interstitial Oxygen Reduction

NORM herausgegeben am 10.1.2002

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The information about the standard:

Designation standards: ASTM F1239-94
Note: UNGÜLTIG
Publication date standards: 10.1.2002
The number of pages: 5
Approximate weight : 15 g (0.03 lbs)
Country: American technical standard
Kategorie: Technische Normen ASTM

Annotation of standard text ASTM F1239-94 :

Keywords:
delta O, interstitial oxygen, oxygen precipitation, oxygen reduction, silicon, ICS Number Code 29.045 (Semiconducting materials)