
Standard Test Method for Determining the Average Electrical Width of a Straight, Thin-Film Metal Line [Metric] (Withdrawn 2009)
NORM herausgegeben am 10.6.1996
Designation standards: ASTM F1261M-96(2003)
Note: UNGÜLTIG
Publication date standards: 10.6.1996
The number of pages: 4
Approximate weight : 12 g (0.03 lbs)
Country: American technical standard
Kategorie: Technische Normen ASTM
Keywords:
aluminum, electrical interconnect, electrical linewidth, linewidth, metallization, semiconductor, test structure, thin film