Standard Guide for Use of an X-Ray Tester (approximately equal10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
NORM herausgegeben am 1.10.2011
Bezeichnung normen: ASTM F1467-11
Anmerkung: UNGÜLTIG
Ausgabedatum normen: 1.10.2011
Zahl der Seiten: 18
Gewicht ca.: 54 g (0.12 Pfund)
Land: Amerikanische technische Norm
Kategorie: Technische Normen ASTM
Keywords:
ionizing radiation effects, microcircuits, radiation hardness, semiconductor devices, X-ray testing: Collimator/collimation, Electrical conductors (semiconductors), Electronic hardness, Experimental design/evaluation, Ionizing radiation, Low-energy radiation, Microcircuits, Microelectronic devices, Radiation exposure--electronic components/devices, Radiation-hardness testing, Semiconductor device testing, X-ray testing, ICS Number Code 31.020 (Electronic components in general)