
Standard Guide for Use of an X-Ray Tester (approximately equal10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
NORM herausgegeben am 1.3.2018
    
        Designation standards: ASTM F1467-18
                
                
                
                Note:    UNGÜLTIG
               
                Publication date standards:  1.3.2018
        The number of pages: 18
Approximate weight : 54 g (0.12 lbs)
        Country:          American technical standard
        Kategorie: Technische Normen ASTM
        
                
              
Keywords:
ionizing radiation effects, microcircuits, radiation hardness, semiconductor devices, X-ray testing,, ICS Number Code 31.020 (Electronic components in general)