Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
NORM herausgegeben am 10.1.1999
Bezeichnung normen: ASTM F1467-99
Anmerkung: UNGÜLTIG
Ausgabedatum normen: 10.1.1999
Zahl der Seiten: 17
Gewicht ca.: 51 g (0.11 Pfund)
Land: Amerikanische technische Norm
Kategorie: Technische Normen ASTM
Keywords:
Collimator, Electrical conductors-semiconductors, Electronic hardness, Experimental design, Hardness tests-radiation (of semiconductors), Ionizing radiation, Low energy ([aprox] 10 keV photons) X-ray sources, Microcircuits, Microelectronic device processing, Radiation effects testing, Radiation exposure-electronic components/devices, Radiation-hardness testing, Semiconductor device testing, X-ray testing, X-ray tester ([aprox] 10 keV photons)-ionizing radiation effects testing