Standard Test Method for Carrier Recombination Lifetime in Silicon Wafers by Noncontact Measurement of Photoconductivity Decay by Microwave Reflectance (Withdrawn 2003)
NORM herausgegeben am 10.6.2000
Bezeichnung normen: ASTM F1535-00
Anmerkung: UNGÜLTIG
Ausgabedatum normen: 10.6.2000
Zahl der Seiten: 12
Gewicht ca.: 36 g (0.08 Pfund)
Land: Amerikanische technische Norm
Kategorie: Technische Normen ASTM
Keywords:
Carrier recombination lifetime, Contactless measurement, Free carrier density, Impurities-semiconductors, Microwave reflection, Photoconductivity decay, Recombination lifetime, Silicon semiconductors-slices/wafers, carrier recombination lifetime-silicon wafers, by noncontact measurement, of photoconductivity decay by microwave reflectance, test, ICS Number Code 29.045 (Semiconducting materials)