Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
NORM herausgegeben am 10.5.1998
Designation standards: ASTM F1892-98
Note: UNGÜLTIG
Publication date standards: 10.5.1998
The number of pages: 35
Approximate weight : 105 g (0.23 lbs)
Country: American technical standard
Kategorie: Technische Normen ASTM
Keywords:
ASIC (application specific integrated circuit), bipolar, cobalt 60 testing, gamma ray tests, ionizing radiation testing, MOS, radiation hardness, semiconductor devices, time dependent effects, total dose testing, X-ray testing, ICS Number Code 31.080.01 (Semi-conductor devices in general)