Standard Test Method for Majority Carrier Concentration in Semiconductors by Measurement of Wavenumber or Wavelength of the Plasma Resonance Minimum

Informationen über die Norm:

Bezeichnung normen: ASTM F398-92(1997)
Anmerkung: UNGÜLTIG
Ausgabedatum normen: 10.6.1997
Zahl der Seiten: 10
Gewicht ca.: 30 g (0.07 Pfund)
Land: Amerikanische technische Norm
Kategorie: Technische Normen ASTM

Die Annotation des Normtextes ASTM F398-92(1997) :

Keywords:
Carrier concentration, Electrical conductors-semiconductors, Gallium arsenide, Germanium-semiconductor applications, Impurities-semiconductors, Infrared (IR) analysis-semiconductors, Minority carriers, Plasma resonance (wavelength), Reflectance and reflectivity-electronic materials/applications, Resonance wavelength, Silicon-semiconductor applications, Spectrophotometry-infrared (of semiconductors), Wavelength, majority carrier concentration in doped semiconductors, by measuring