ASTM F522-94

Test Method for Stacking Fault Density of Epitaxial Layers of Silicon by Interference-Contrast Microscopy (Withdrawn 1998)

Englisch -
Sicheres Online-PDF (62.50 EUR)

Englisch -

Gedruckt (62.50 EUR)

The information about the standard:

Designation standards: ASTM F522-94
Note: UNGÜLTIG
The number of pages: 4
Approximate weight : 12 g (0.03 lbs)
Country: American technical standard
Kategorie: Technische Normen ASTM

Annotation of standard text ASTM F522-94 :

Keywords:
ICS Number Code 29.045 (Semiconducting materials)