Standard Test Methods for Measuring Resistivity of Semiconductor Slices or Sheet Resistance of Semiconductor Films with a Noncontact Eddy-Current Gage (Includes all amendments And changes 8/16/2017).
NORM herausgegeben am 1.1.1996
Bezeichnung normen: ASTM F673-90(1996)e1
Anmerkung: UNGÜLTIG
Ausgabedatum normen: 1.1.1996
Zahl der Seiten: 11
Gewicht ca.: 33 g (0.07 Pfund)
Land: Amerikanische technische Norm
Kategorie: Technische Normen ASTM
Keywords:
Contactless measurements, Eddy current examination, Electrical conductors-semiconductors, Electromagnetic (eddy current) testing, Nondestructive evaluation (NDE)-semiconductors, Resistivity (electrical)-semiconductors, Sheet resistance, Silicon semiconductors-slices/wafers, resistivity of semiconductor slices/sheet resistance of semiconductor, films, with non-contact eddy-current gage, test,,Order Form, ICS Number Code 29.045 (Semiconducting materials)