Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric]
NORM herausgegeben am 1.5.2010
Bezeichnung normen: ASTM F744M-10
Anmerkung: UNGÜLTIG
Ausgabedatum normen: 1.5.2010
Zahl der Seiten: 7
Gewicht ca.: 21 g (0.05 Pfund)
Land: Amerikanische technische Norm
Kategorie: Technische Normen ASTM
Keywords:
DIC, digital integrated circuits, dose rate, ionizing radiation, radiation dose rate, threshold for upset, upset, Circuitry, Current measurement--semiconductors, Destructive testing--semiconductors, Dose rate threshold, Dosimetry, Electrical conductors (semiconductors), Electron linear accelerator, Flash X-ray machines (FXR), Irradiance/irradiation--semiconductors, Lasers and laser applications, Linear threshold voltage, Radiation exposure--electronic components/devices, Upset threshold, Voltage