Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits
NORM herausgegeben am 1.1.1997
Bezeichnung normen: ASTM F744M-97
Anmerkung: UNGÜLTIG
Ausgabedatum normen: 1.1.1997
Zahl der Seiten: 6
Gewicht ca.: 18 g (0.04 Pfund)
Land: Amerikanische technische Norm
Kategorie: Technische Normen ASTM
Keywords:
Circuitry, Current measurement-semiconductors, Destructive testing-semiconductors, Dose rate threshold, Dosimetry, Electrical conductors-semiconductors, Electron linear accelerator, Flash x-ray machines (FXR), Integrated circuits, Irradiance/irradiation-semiconductors, Lasers and laser applications, Linear threshold voltage, Radiation exposure-electronic components/devices, Upset threshold, Voltage, radiation dose rate threshold for determining upset threshold of digital