
Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric]
NORM herausgegeben am 10.2.1997
Designation standards: ASTM F744M-97(2003)
Note: UNGÜLTIG
Publication date standards: 10.2.1997
The number of pages: 6
Approximate weight : 18 g (0.04 lbs)
Country: American technical standard
Kategorie: Technische Normen ASTM
Keywords:
DIC, digital integrated circuits, dose rate, ionizing radiation, radiation dose rate, threshold for upset, upset