Test Method for Wafer and Slice Flatness by Interferometric (Withdrawn 1991)
Designation standards: ASTM F775-88
Note: UNGÜLTIG
The number of pages: 7
Approximate weight : 21 g (0.05 lbs)
Country: American technical standard
Kategorie: Technische Normen ASTM
Keywords:
ICS Number Code 29.045 (Semiconducting materials)