ASTM F815-88(1993)e1

Test Method for Detection of Epitaxial Spikes (Withdrawn 1999) (Includes all amendments And changes 8/16/2017).

NORM herausgegeben am 1.1.1993

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The information about the standard:

Designation standards: ASTM F815-88(1993)e1
Note: UNGÜLTIG
Publication date standards: 1.1.1993
The number of pages: 2
Approximate weight : 6 g (0.01 lbs)
Country: American technical standard
Kategorie: Technische Normen ASTM

Annotation of standard text ASTM F815-88(1993)e1 :

Keywords:
Epitaxial spikes, Nondestructive evaluation (NDE)-semiconductors, Pass-fail test, Visual examination-electronic components/devices, epitaxial spike detection on silicon wafers, pass-fail test,, Silicon-semiconductor applications, wafers-epitaxial spike detection, test, ICS Number Code 31.080.30 (Transistors)