ASTM F817-83(1990)

Test Method for Characterization of Film Resistor Materials and Processes (Withdrawn 1996)

NORM herausgegeben am 1.1.1983

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The information about the standard:

Designation standards: ASTM F817-83(1990)
Note: UNGÜLTIG
Publication date standards: 1.1.1983
The number of pages: 16
Approximate weight : 48 g (0.11 lbs)
Country: American technical standard
Kategorie: Technische Normen ASTM

Annotation of standard text ASTM F817-83(1990) :

Keywords:
Diffusion, Electrical conductors-semiconductors, Film resistors, Linwood least squares test, Microcircuits, Resistance and resistivity (electrical)-semiconductors, Resistors-film, Statistical methods-electronic components/devices, film resistor (thick/thin) materials/processes-characterization, test