Guide for The Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices

Informationen über die Norm:

Bezeichnung normen: ASTM F980-92
Anmerkung: UNGÜLTIG
Ausgabedatum normen: 1.1.1992
Zahl der Seiten: 5
Gewicht ca.: 15 g (0.03 Pfund)
Land: Amerikanische technische Norm
Kategorie: Technische Normen ASTM

Die Annotation des Normtextes ASTM F980-92 :

Keywords:
Annealing, Defects-semiconductors, Destructive testing-semiconductors, Displacement damage, Electrical conductors-semiconductors, Electronic hardness, Hardness tests-radiation (of semiconductors), Integrated circuits, Neutron radiation, Pulsed neutron-radiation source, Radiation exposure-electronic components/devices, Radiation-hardness testing, Short term damage, Vulnerability, rapid annealing of neutron-induced displacement damage in semiconductor, devices, guide,, Rapid annealing effects