Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
NORM herausgegeben am 1.11.2019
Designation standards: ASTM E1438-11(2019)
Publication date standards: 1.11.2019
The number of pages: 3
Approximate weight : 9 g (0.02 lbs)
Country: American technical standard
Kategorie: Technische Normen ASTM
Keywords:
ICS Number Code 29.045 (Semiconducting materials)