Standard Guide for Performing Sputter Crater Depth Measurements
NORM herausgegeben am 1.11.2019
Designation standards: ASTM E1634-11(2019)
Publication date standards: 1.11.2019
The number of pages: 3
Approximate weight : 9 g (0.02 lbs)
Country: American technical standard
Kategorie: Technische Normen ASTM
Keywords:
Auger electron spectroscopy, secondary ion mass spectrometry, stylus profilometry, surface analysis , X-ray photoelectron spectroscopy,, ICS Number Code 71.040.50 (Physicochemical methods of analysis)