Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
NORM herausgegeben am 15.6.2008
Bezeichnung normen: ASTM F76-08
Anmerkung: UNGÜLTIG
Ausgabedatum normen: 15.6.2008
Zahl der Seiten: 14
Gewicht ca.: 42 g (0.09 Pfund)
Land: Amerikanische technische Norm
Kategorie: Technische Normen ASTM
Keywords:
gallium arsenide, Hall coefficient, Hall data, Hall mobility, Hall resistivity, semiconductor, silicon, single crystal, van der Pauw, Bridge-type electrical/electronic materials, Crystal lattice structure, Eight-contact semiconductor specimens, Electrical conductors (semiconductors), Electrical resistance/resistivity--semiconductors, Etching (materials/process), Gallium arsenide phosphide, Germanium--semiconductor applications, Hall effect measurement, Lamellar semiconductor materials