Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
NORM herausgegeben am 1.12.2016
Designation standards: ASTM F980-16
Note: UNGÜLTIG
Publication date standards: 1.12.2016
The number of pages: 7
Approximate weight : 21 g (0.05 lbs)
Country: American technical standard
Kategorie: Technische Normen ASTM
Keywords:
annealing factor, annealing function, displacement damage, integrated circuits, neutron damage, neutron degradation, photoconducting device, rapid annealing, semiconductor devices ,, ICS Number Code 29.045 (Semiconducting materials)