
Semiconductor devices. Mechanical and climatic test methods. Board level drop test method using an accelerometer.
NORM herausgegeben am 30.5.2008
Designation standards: BS EN 60749-37:2008
Note: UNGÜLTIG
Publication date standards: 30.5.2008
The number of pages: 22
Approximate weight : 66 g (0.15 lbs)
Country: British technical standard
Kategorie: Technische Normen BS