BS EN 60749-38:2008

Semiconductor devices. Mechanical and climatic test methods. Soft error test method for semiconductor devices with memory.

NORM herausgegeben am 30.6.2008

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The information about the standard:

Designation standards: BS EN 60749-38:2008
Publication date standards: 30.6.2008
The number of pages: 16
Approximate weight : 48 g (0.11 lbs)
Country: British technical standard
Kategorie: Technische Normen BS

Annotation of standard text BS EN 60749-38:2008 :

ISBN: 978 0 580 54875 8 Status: Definitive