Semiconductor devices. Mechanical and climatic test methods. Damp heat, steady state, highly accelerated stress test (HAST).
NORM herausgegeben am 10.9.2002
Designation standards: BS EN 60749-4:2002
Note: UNGÜLTIG
Publication date standards: 10.9.2002
The number of pages: 12
Approximate weight : 36 g (0.08 lbs)
Country: British technical standard
Kategorie: Technische Normen BS