BS EN 60749-44:2016

Semiconductor devices. Mechanical and climatic test methods. Neutron beam irradiated single event effect (SEE) test method for semiconductor devices.

NORM herausgegeben am 30.11.2016

The information about the standard:

Designation standards: BS EN 60749-44:2016
Publication date standards: 30.11.2016
The number of pages: 26
Approximate weight : 78 g (0.17 lbs)
Country: British technical standard
Kategorie: Technische Normen BS