BS EN 62047-18:2013

Semiconductor devices. Micro-electromechanical devices. Bend testing methods of thin film materials.

NORM herausgegeben am 31.10.2013

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The information about the standard:

Designation standards: BS EN 62047-18:2013
Publication date standards: 31.10.2013
The number of pages: 18
Approximate weight : 54 g (0.12 lbs)
Country: British technical standard
Kategorie: Technische Normen BS

Annotation of standard text BS EN 62047-18:2013 :

ISBN: 978 0 580 72011 6 Status: Definitive