BS IEC 62880-1:2017

Semiconductor devices. Stress migration test standard. Copper stress migration test standard.

NORM herausgegeben am 21.7.2020

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The information about the standard:

Designation standards: BS IEC 62880-1:2017
Publication date standards: 21.7.2020
The number of pages: 28
Approximate weight : 84 g (0.19 lbs)
Country: British technical standard
Kategorie: Technische Normen BS

Annotation of standard text BS IEC 62880-1:2017 :

ISBN: 978 0 580 85808 6 Status: Definitive