
Surface chemical analysis. Secondary-ion mass spectrometry. Determination of boron atomic concentration in silicon using uniformly doped materials.
NORM herausgegeben am 31.8.2010
Designation standards: BS ISO 14237:2010
Publication date standards: 31.8.2010
The number of pages: 30
Approximate weight : 90 g (0.20 lbs)
Country: British technical standard
Kategorie: Technische Normen BS
ISBN: 978 0 580 57402 3 Status: Confirmed