BS ISO 14701:2018

Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness.

NORM herausgegeben am 5.11.2018

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The information about the standard:

Designation standards: BS ISO 14701:2018
Publication date standards: 5.11.2018
The number of pages: 26
Approximate weight : 78 g (0.17 lbs)
Country: British technical standard
Kategorie: Technische Normen BS

Annotation of standard text BS ISO 14701:2018 :

ISBN: 978 0 580 51949 9 Status: Under Review