BS ISO 16413:2020

Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting.

NORM herausgegeben am 18.8.2020

The information about the standard:

Designation standards: BS ISO 16413:2020
Publication date standards: 18.8.2020
The number of pages: 42
Approximate weight : 126 g (0.28 lbs)
Country: British technical standard
Kategorie: Technische Normen BS