DIN EN 60749-29:2004-07

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test.

NORM herausgegeben am 1.7.2004

The information about the standard:

Designation standards: DIN EN 60749-29:2004-07
Note: UNGÜLTIG
Publication date standards: 1.7.2004
The number of pages: 22
Approximate weight : 66 g (0.15 lbs)
Country: German technical standard
Kategorie: Technische Normen DIN