DIN EN 60749-3:2018-01

Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination.

NORM herausgegeben am 1.1.2018

The information about the standard:

Designation standards: DIN EN 60749-3:2018-01
Publication date standards: 1.1.2018
The number of pages: 14
Approximate weight : 42 g (0.09 lbs)
Country: German technical standard
Kategorie: Technische Normen DIN