
Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 3: Aluminium (Al), Arsenic (As), Barium (Ba), Beryllium (Be), Bismuth (Bi), Calcium (Ca), Cadmium (Cd), Cobalt (Co), Chromium (Cr), Copper (Cu), Iron (Fe), Gallium (Ga), Germanium (Ge), Hafnium (Hf), Indium (In), Potassium (K), Lithium (Li), Magnesium (Mg), Manganese (Mn), Molybdenum (Mo), Nickel (Ni), Niobium (Nb), Lead (Pb), Antimony (Sb), Tin (Sn), Strontium (Sr), Tantalum (Ta), Titani...
NORM herausgegeben am 1.11.2012
Designation standards: E DIN 50451-3:2012-11
Note: UNGÜLTIG
Publication date standards: 1.11.2012
The number of pages: 19
Approximate weight : 57 g (0.13 lbs)
Country: German technical standard
Kategorie: Technische Normen DIN
Prüfung von Materialien für die Halbleitertechnologie - Bestimmung von Elementspuren in Flüssigkeiten - Teil 3: Aluminium (Al), Arsen (As), Barium (Ba), Beryllium (Be), Bismut (Bi), Calcium (Ca), Cadmium (Cd), Cobalt (Co), Chrom (Cr), Kupfer (Cu), Eisen (Fe), Gallium (Ga), Germanium (Ge), Hafnium (Hf), Indium (In), Kalium (K), Lithium (Li), Magnesium (Mg), Mangan (Mn), Molybdän (Mo), Nickel (Ni), Niob (Nb), Blei (Pb), Antimon (Sb), Zinn (Sn), Strontium (Sr), Tantal (Ta), Titan (Ti), Vanadium ...