GB 6621-1986

Standard method for measuring surface flatness of polished silicon wafers by noncontact technique

NORM herausgegeben am 1.1.1986

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The information about the standard:

Designation standards: GB 6621-1986
Note: UNGÜLTIG
Publication date standards: 1.1.1986
Country: Chinese technical standard
Kategorie: Technische Normen GB