GB/T 13388-1992

Method for measuring crystallographic orientation of flats on single crystal silicon slices and wafers by X-ray techniques

NORM herausgegeben am 19.2.1992

The information about the standard:

Designation standards: GB/T 13388-1992
Note: UNGÜLTIG
Publication date standards: 19.2.1992
Country: Chinese technical standard
Kategorie: Technische Normen GB