GB/T 17169-1997

Test method for the surface quality of polished silicon wafers and epitaxial wafers by optical-reflection

NORM herausgegeben am 22.12.1997

The information about the standard:

Designation standards: GB/T 17169-1997
Note: UNGÜLTIG
Publication date standards: 22.12.1997
Country: Chinese technical standard
Kategorie: Technische Normen GB