GB/T 19444-2004

Oxygen precipitation characterization of silicon wafers by measurement of interstitial oxygen reduction

NORM herausgegeben am 5.2.2004

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The information about the standard:

Designation standards: GB/T 19444-2004
Note: UNGÜLTIG
Publication date standards: 5.2.2004
Country: Chinese technical standard
Kategorie: Technische Normen GB