Surface chemical analysisChemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
NORM herausgegeben am 27.3.2014
Designation standards: GB/T 30701-2014
Publication date standards: 27.3.2014
Country: Chinese technical standard
Kategorie: Technische Normen GB