GB/T 39145-2020

Test method for the content of surface metal elements on silicon wafers—Inductively coupled plasma mass spectrometry

NORM herausgegeben am 11.10.2020

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The information about the standard:

Designation standards: GB/T 39145-2020
Publication date standards: 11.10.2020
Country: Chinese technical standard
Kategorie: Technische Normen GB