GB/T 42709.3-2026

Semiconductor devices—Micro-electromechanical devices—Part 3: Thin film standard test piece for tensile testing

NORM herausgegeben am 30.4.2026

English, Chinesisch -
Elektronische PDF (AUF ANFRAGE)

The information about the standard:

Designation standards: GB/T 42709.3-2026
Note: Execute Date: november 2026
Publication date standards: 30.4.2026
Country: Chinese technical standard
Kategorie: Technische Normen GB