GB/T 47082-2026

Test method for stacking faults of polished monocrystalline silicon carbide wafers

NORM herausgegeben am 28.1.2026

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The information about the standard:

Designation standards: GB/T 47082-2026
Note: Execute Date: august 2026
Publication date standards: 28.1.2026
Country: Chinese technical standard
Kategorie: Technische Normen GB