GB/T 48168-2026

Semiconductor devices—Reliability test method by inductive load switching stress for gallium nitride(GaN) transistors

NORM herausgegeben am 28.8.2026

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The information about the standard:

Designation standards: GB/T 48168-2026
Note: Execute Date: march 2027
Publication date standards: 28.8.2026
Country: Chinese technical standard
Kategorie: Technische Normen GB