
Semiconductor devices—Mechanical and climate test methods—Part 28: Electrostatic discharge (ESD) sensitivity testing—Charged device model (CDM)—device level
NORM herausgegeben am 27.2.2026
Designation standards: GB/T 4937.28-2026
Note: Execute Date: september 2026
Publication date standards: 27.2.2026
Country: Chinese technical standard
Kategorie: Technische Normen GB